Field Emission Scanning Electron Microscope 4 (EDS)
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| Short Name | FESEM 4 (EDS) |
| Model Name | JSM-7600F |
| Laboratory | 미세구조분석실//[81B101]주사전자현미경실Ⅱ,Ⅳ |
| maker | JEOL |
| Installed Year/Price | 201104 / 468,404,015 |
| Staff Name | 김순섭 031-299-6776 |
| Main Appplication Field | |
| Analysis of phase, chemical elements, crystal structure at small region for materials needing the high resolution 고해상도를 요구하는 재료의 상관찰, 화학조성분석, 결정구조분석 | |
| Basic Specification | |
| - EI resolution : 1.5 nm (1 kV) in GB mode, 1.0 nm (15 kV) - Magnification 25 to 1,000,000x - Accelerating voltage 0.1 to 30 kV - EDS 장착 | |