Surface Analysis Lab. / Instruments Detail Information
| No. | Equipment Name | Short Name of Equipment | Equipment Model | Staff Name | Phone Number |
|---|---|---|---|---|---|
| 1 | Secondary Ion Mass Spectrometer | SIMS | TOF-SIMS-5 | 홍문규(Hong Moon-Kyu) |
031-299-6764
|
| 2 | High Resolution Atomic Force Microscope | HR-AFM(Bio 겸용) | NanoWizard Ultra Speed | 홍문규(Hong Moon-Kyu) |
031-299-6764
|
| 3 | 3D Measuring Laser Confocal Microscope | 3D LSM | OLS5100 | 홍문규(Hong Moon-Kyu) |
031-299-6764
|
| 4 | Profiler | Profiler | Bruker DXT-A | 홍문규(Hong Moon-Kyu) |
031-299-6764
|
| 5 | Ellipsometer | Ellipsometer | SENResearch | 이은영 |
031-299-6750
|
| 6 | Mask Aligner | Mask Aligner | MA/BA6 | 홍문규(Hong Moon-Kyu) |
031-299-6764
|
| 7 | Feild Emission Auger Electron Spectrometer | AES | JAMP-9500F | 이은영(Lee Eunyoung) |
031-299-6750
|
| 8 | X-ray Photoelectron Spectrometer 1(ESCALAB250Xi) | XPS 1 (ESCALAB250Xi) | ESCALAB250 | 이은영 |
031-299-6750
|
| 9 | X-ray Photoelectron Spectrometer 2(Only super user) | XPS 2(Super user) | JPS-9030 | 이은영 |
031-299-6750
|
| 10 | X-ray Photoelectron Spectrometer 3(NEXSA) | XPS 3 (NEXSA) | NEXSA G2 | 용진영 |
031-299-6762
|
| 11 | High Power Powder X-Ray Diffractometer System | HP-Powder XRD_1(Bruker) | D8 ADVANCE | 김미래(Kim Mirae) |
031-299-6736
|
| 12 | High Power Powder X-Ray Diffractometer | HP-Powder XRD_2 (Rigaku) | Smartlab | 김미래 |
031-299-6736
|
| 13 | High Power, High Resolution Multi Purpose X-Ray Diffractometor | 다목적 XRD (Rigaku) | Smartlab | 김미래(Kim Mirae) |
031-299-6736
|