High Resolution Transmission Electron Microscope 1 (EDS)
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| Short Name | HRTEM 1 (EDS) |
| Model Name | JEM-3010 |
| Laboratory | 미세구조분석실//[82105]투과전자현미경실Ⅰ |
| maker | JEOL |
| Installed Year/Price | 199910 / 745,358,368 |
| Staff Name | 김지혜(Kim Jihye) 031-299-6738 |
| Main Appplication Field | |
| The equipment measure the phase and crystal structure for tiny region using transmission electron, diffraction electron, and X-ray after electron beam with a short wavelength pass through a sample with nano-thickness.짧은 파장의 전자선을 시편에 투과 시킨 후 투과전자, 회절전자, X-선 등을 이용하여 미소 영역의 상관찰, 결정구조 해석 및 조성을 분석하는 기기 | |
| Basic Specification | |
| ◎ TEM Unit - Acceleration voltage : 100 ~ 300 kV - Resolution : Point image :2.0 Å Lattice image :1.4 Å ◎ EDS unit -point, line, map 분석 불가(STEM 없음) | |