Features of XPS system
- ccrf
- Hit1903
- 2016-01-14
We inform you the X-ray Photoelectron Spectrometer(XPS) system features: -High sensitivity spectroscopy -Small area XPS depth profiling capability -Multi-technique analytical versatility -Many sample preparation options -Automated, unattended analysis -Multiple sample analysis For more information: CCRF OFFICE(031-299-6764) Hyun-chang Shin
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